Rigaku Corporation is accelerating development of next-generation semiconductor metrology technologies through an expanded collaboration with imec, as chipmakers face growing manufacturing complexity…
Tag:
Semiconductor Metrology
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NewsProduct LaunchSemiconductorsTechnology
Bruker, imec Collaborate on Nanoscale Semiconductor Research
by EC Editorby EC EditorBruker Corporation has announced accelerated development of its photothermal AFM-IR spectroscopy capabilities, aiming to address emerging research challenges in the semiconductor industry…
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NewsProduct LaunchSemiconductorsTechnology
Photo electron Soul’s GaN e-Beam Innovation Gains Kioxia’s Nod for Testing
by EC Editorby EC EditorKioxia Iwate Corp., a unit of Japanese memory chipmaker Kioxia Holdings, will begin evaluating next-generation inspection and metrology technology jointly developed by…
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AI / AR / VRNewsProduct LaunchSemiconductorsTechnology
Quartz Rolls Out PCI-AM 9 with AI Tools for Faster Semiconductor Analysis
by EC Editorby EC EditorQuartz Imaging Corporation, a provider of microscopy and metrology software, has launched PCI-AM Version 9, its most advanced software release to date.…
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NewsProduct LaunchSemiconductorsTechnology
Rigaku Begins Mass Production of Breakthrough X-ray Tool for Semiconductors
by EC Editorby EC EditorRigaku Corporation, a leading Japanese developer of X-ray metrology systems, has launched mass production of its XTRAIA XD-3300, a high-resolution microspot X-ray…
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